Textul licitației

: Dublin City University seeks to expand its research capacity in terms of X-ray photoelectron spectroscopy XPS by establishing an Advanced Material Characterisation and Imaging Platform which combines several key characterisation methods into a single, user-friendly instrument. The system will be able to provide XPS spectroscopy at higher photon energy than commonly used in laboratories, the system must be able to operate in imaging mode creating elemental maps and be able to provide additional measurement modes including: Scanning electron microscopy SEM for sample inspection/area selection, Scanning Auger microscopy SAM for complementary elemental analysis, UV photoelectron spectroscopy UPS for higher resolution valence band measurements, Inverse photoemission IPES for conduction band measurements, A method of sample sputtering to create depth profiles of all measurements. The sy