Test CZ-Si wafer 4 inch, thickness = 525 ± 25 μm, (100), 1-side polished, n-type (Phosphor), 1 - 20
Data licitatiei 05.11.2025
Expirat

9

9
| Valoare estimata : 1,820 RON
|
Tip anunt:
Cumparari directe
|
ID: 10227619
|
Data publicarii :
05.11.2025
|
Tara/Judet:
RO/Ilfov |
|
Descriere scurta:
Test CZ-Si wafer 4 inch, thickness = 525 ± 25 μm, (100), 1-side polished, n-type (Phosphor), 1 - 20
Coduri CPV:
24311160-6 - Siliciuri
|
Textul licitației
1820 RON (359.22 EUR)
Data de raspuns a ofertantului:
Data limita de raspuns a autoritatii contractante:
Repere Achizitionate
Test CZ-Si wafer 4 inch, thickness = 525 ± 25 μm, (100), 1-side polished, n-type (Phosphor), 1 - 20
Numar de referinta: Test CZ-Si wafer 4 inch, thickness = 525 ± 25 μm,
Pret de catalog: 1820 RON / Unitate de masura
Unitate de masura: bucata